Single-crystal X-ray diffraction (SC-XRD) is often referred to as the gold standard of sample characterisation, offering three-dimensional structure of both molecules and their crystalline packing, ...

The high sensitivity of the reflection electron microscopy (REM) technique to small changes in the crystal structure and composition of the top surface layers of various crystalline materials makes it ...

This article has been updated in January 2024. High resolution images of microscopic samples can be obtained experimentally using Scanning Electron Transmission Microscopy (STEM). It is an effective ...

In geology, electron backscatter diffraction (EBSD) is a powerful tool for the observation and analysis of microstructures and for phase identification. The EBSD system, by Oxford Instruments, ...

Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.