In a collaboration with Institute of Physics at the Chinese Academy of Sciences (IPCAS), researchers from Beijing University of Technology (BJUT) discovered a new type of grain-interior planar defect ...
Figure 1: The duality of fatigue data caused by competing failure modes in the titanium alloy, Ti-10V-2Fe-3Al for two microstructures, B and E. Figure 2: Micrographs illustrating the defect clusters ...
FFT-EM is an innovative method that represents a combination of FFT and EM techniques such as scanning electron microscopy (SEM). The technique is often used to determine the interior and surface ...
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