Marposs, a manufacturer of measurement, test and inspection technologies, has expanded its VTS (visual tool setter) family with the new VTS SF-45 Compact. The VTS SF-45 is designed for non-contact, ...

Measuring super smooth surfaces generally necessitates the use of optical metrology tools, but it is important to note that optical solutions are not all the same. The choice of metrology solution for ...

Stacking chips is making it far more difficult to find existing and latent defects, and to check for things like die shift, leftover particles from other processes, co-planarity of bumps, and adhesion ...

A new publication from Opto-Electronic Science; DOI 10.29026/oes.2023.220024 considers a precise measurement technology of optical coherent structure of random lights. Optical manipulation and ...

University of Illinois Physics Professor Paul Kwiat and members of his research group have developed a new tool for precision measurement at the nanometer scale in scenarios where background noise and ...

Portable 3D optical inspection with 4Di InSpec transforms surface metrology, enhancing defect detection and quality assurance ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

The Korea Research Institute of Standards and Science has successfully developed a length measurement system that achieves a level of precision approaching the theoretical limit allowed by quantum ...

The W. M. Keck Optical Measurement Laboratory (JILA Keck Lab) operates and manages both the Optical Metrology Lab and JILA's Micro and Nanofabrication Facility. The Keck Lab is a user-based facility ...