Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...

The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...

Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...

A technical paper titled “Best Practices for Advanced Modeling of Safety Mechanisms in an FTA” was published by researchers at University of Stuttgart, Robert Bosch GmbH, Audi AG, and Porsche AG. “To ...

This paper introduces a unified framework to perform fault tracking based on a technology-independent and consistent generic functional model capable of representing the entire automotive system while ...

This aerial image of the San Andreas Fault in the Carrizo Plain shows numerous curved drainages where fault slip has stretched stream channels to the left. Eventually, the channels get ‘reset’ when ...